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Patent Searching and Data


Title:
METHOD FOR AUTOMATICALLY GENERATING TEACHING DATA OF AUTOMATED OPTICAL INSPECTION MACHINE
Document Type and Number:
WIPO Patent Application WO/2014/157920
Kind Code:
A1
Abstract:
The present invention relates to a method for automatically generating teaching data of an automated optical inspection (AOI) machine, which automatically recognizes a teaching start point and a teaching end point through pattern matching for predetermined solder shape information, without external information such as a Gerber-file or a manual teaching process performed by an operator, and sequentially and repeatedly searches whether brightness values for each position within an image satisfy predetermined conditions, and thus can automatically obtain a link (wiring) path for connecting the teaching start point and the teaching end point.

Inventors:
PARK CHAN WHA (KR)
CHO YOUNG IL (KR)
KIM TAE JUN (KR)
Application Number:
PCT/KR2014/002507
Publication Date:
October 02, 2014
Filing Date:
March 25, 2014
Export Citation:
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Assignee:
MIRTEC CO LTD (KR)
International Classes:
G06F19/00; G01B11/30; G01N21/88; H05K13/08
Foreign References:
KR20100010129A2010-02-01
KR20120086410A2012-08-03
KR20120107329A2012-10-02
KR20090116114A2009-11-11
KR20030085616A2003-11-07
Attorney, Agent or Firm:
TAEDONG INTERNATIONAL PATENT&LAW (KR)
특허법인태동 (KR)
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