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Title:
METHOD FOR CALCULATING CHROMATICITY MEASUREMENT CONDITIONS, CHROMATICITY MEASUREMENT METHOD, DEVICE FOR CALCULATING CHROMATICITY MEASUREMENT CONDITIONS, AND CHROMATICITY MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2014/010519
Kind Code:
A1
Abstract:
This method for calculating chromaticity measurement conditions has a measurement distance determination procedure for determining a measurement distance, which is the distance between a color display device and a chromaticity measurement device, on the basis of a dot width ratio, the dot width ratio being the ratio between the dot width ratio of the color display device and a value that corresponds to the size of the measurement area of the chromaticity measurement device for measuring the chromaticity of the color display device, and being a value determined in accordance with a desired chromaticity error.

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Inventors:
HOSOKI MITSURU
Application Number:
PCT/JP2013/068469
Publication Date:
January 16, 2014
Filing Date:
July 05, 2013
Export Citation:
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Assignee:
SHARP KK (JP)
International Classes:
G01J3/50; G01M11/00
Foreign References:
JP2006349835A2006-12-28
JP2007093466A2007-04-12
JP2012244555A2012-12-10
JP2005318460A2005-11-10
JP2008528341A2008-07-31
Attorney, Agent or Firm:
FUNAYAMA Takeshi et al. (JP)
Takeshi Funayama (JP)
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