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Title:
METHOD FOR CALCULATING DISTORTION AMOUNT IN PLANE SURFACE DETECTOR
Document Type and Number:
WIPO Patent Application WO/2019/049234
Kind Code:
A1
Abstract:
When calculating a distortion amount in a detection surface 31 of a plane surface detector 3 of X-ray equipment 1, a user first disposes a calibration phantom 10 between a light source 2 and the plane surface detector 3. Then, the attitude of the calibration phantom 10 is changed from an initial state, X-rays are emitted from the light source 2 before and after the attitude change, and a plurality of projection images are generated. Further, on the basis of the respective coordinates of sphere images in the generated projection images, the distortion amount in the detection surface 31 of the plane surface detector 3 is calculated. This configuration enables dispensing with work for measuring in advance the positions of a plurality of spheres in the calibration phantom 10, work for checking in advance the dimensions of the plurality of spheres in the calibration phantom 10, and the like, so that the burden of work can be reduced.

Inventors:
OOHARA HIROSHI (JP)
SATO MAKOTO (JP)
Application Number:
PCT/JP2017/032085
Publication Date:
March 14, 2019
Filing Date:
September 06, 2017
Export Citation:
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Assignee:
SHIMADZU CORP (JP)
International Classes:
G01B15/00; A61B6/00; G01T7/00
Foreign References:
JPS63222210A1988-09-16
JP2012037345A2012-02-23
US5442674A1995-08-15
JP2006223868A2006-08-31
JP2005021675A2005-01-27
Attorney, Agent or Firm:
YOSHIMOTO, Tsutomu et al. (JP)
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