Title:
METHOD FOR CALIBRATING A SPECTRORADIOMETER
Document Type and Number:
WIPO Patent Application WO/2016/087402
Kind Code:
A3
Abstract:
The invention relates to a method for calibrating a spectroradiometer (1), comprising the following method steps: capture of light measurement data by the measurement of the radiation of at least one standard light source (4) using the spectroradiometer (1) that is to be calibrated; derivation of calibrated data from the light measurement data by the comparison of the captured light measurement data with known data of the standard light source (4); and calibration of the spectroradiometer (1) according to the calibration data. The aim of the invention is to provide a reliable and practical method for calibrating the spectroradiometer (1). In particular, the synchronism of spectroradiometers (1) situated in different locations (9, 10, 11) is to be produced simply and reliably. To achieve this aim, the validity, i.e. the usability, of the standard light source for the calibration is checked by a comparison of the light measurement data of the standard light source (4) with light measurement data of one or more additional standard light sources (4) of the same type, the validity of the standard light source (4) being established if the deviations of the light measurement data of the standard light sources (4) from one another lie below predefined limit values, and/or the standard light source (4) is measured using two or more standard spectroradiometers (1') of the same type or of different types, the validity of the standard light source (4) being established if the deviations of the light measurement data from one another, said data being captured using the different standard spectroradiometers (1'), lie below predefined limit values.
Inventors:
FRANK FELIX (DE)
YOUNG RICHARD (GB)
RÄBIGER JULIANE (DE)
HÄRING RETO (DE)
YOUNG RICHARD (GB)
RÄBIGER JULIANE (DE)
HÄRING RETO (DE)
Application Number:
PCT/EP2015/078129
Publication Date:
September 01, 2016
Filing Date:
December 01, 2015
Export Citation:
Assignee:
INSTRUMENT SYSTEMS OPTISCHE MESSTECHNIK GMBH (DE)
International Classes:
G01J3/10; G01J3/52
Domestic Patent References:
| WO2008137169A2 | 2008-11-13 | |||
| WO2000003213A1 | 2000-01-20 | |||
| WO2014011729A1 | 2014-01-16 | |||
| WO2014123522A1 | 2014-08-14 |
Foreign References:
| JP2004177147A | 2004-06-24 | |||
| EP1314972A1 | 2003-05-28 | |||
| JP2014081275A | 2014-05-08 | |||
| EP1694049A1 | 2006-08-23 | |||
| DE102008033544A1 | 2010-01-21 |
Other References:
EIN LEITFADEN ET AL: "Grundlagen zur Norm ISO/IEC 17025 und deren Implementierung", 3 September 2009 (2009-09-03), XP055264198, Retrieved from the Internet [retrieved on 20160411]
Attorney, Agent or Firm:
SCHNEIDERS & BEHRENDT et al. (Bochum, DE)
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