METHOD OF COLLECTING AND PROCESSING ELECTRON DIFFRACTION DATA

Title:

METHOD OF COLLECTING AND PROCESSING ELECTRON DIFFRACTION DATA

Document Type and Number:

WIPO Patent Application WO/2013/013134

Kind Code:

A3

Abstract:

One aspect of the present disclosure is a method for determining an atomic pair distribution function of a sample using electron diffraction. According to this method, the sample is exposed to a beam of electrons. The sample causes electrons to scatter from the beam, the scattered electrons are detected, and a diffraction pattern of the sample is produced. Either the sample or the electron beam can be manipulated to limit the exposure of the sample to the electron beam. Limiting the sample's exposure to the electron beam can reduce damage to the sample. Finally, the signal is analyzed to determine the atomic pair distribution function of the sample.

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Inventors:

BILLINGE SIMON (US)
FARROW CHRISTOPHER (US)
KANATZIDIS MERCOURI (US)
GORELIK TATIANA E (DE)
SCHMIDT MARTIN U (DE)

Application Number:

PCT/US2012/047568

Publication Date:

March 07, 2013

Filing Date:

July 20, 2012

Export Citation:

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Assignee:

UNIV COLUMBIA (US)
BILLINGE SIMON (US)
FARROW CHRISTOPHER (US)
KANATZIDIS MERCOURI (US)
GORELIK TATIANA E (DE)
SCHMIDT MARTIN U (DE)

International Classes:

G01N31/00

Foreign References:

US20070243620A1	2007-10-18
US20110049363A1	2011-03-03
US7053372B2	2006-05-30
US20100000853A1	2010-01-07
US20100108881A1	2010-05-06
US6570163B1	2003-05-27
US20080149831A1	2008-06-26
US20100108883A1	2010-05-06
US20040011958A1	2004-01-22
US5080495A	1992-01-14

Other References: