Title:
METHOD FOR CORRECTING MEASUREMENT ERROR RESULTING FROM MEASUREMENT DEVICE TEMPERATURE DISPLACEMENT AND MASS SPECTROMETER USING SAID METHOD
Document Type and Number:
WIPO Patent Application WO/2017/064802
Kind Code:
A1
Abstract:
A cylindrical-rod-shaped reference member (5) comprising a material having a coefficient of thermal expansion different from that of a flight tube (2) is installed so as to be in contact with the tube (2), and the tube (2) is fixed to an end of the reference member (5) using a fixing part (6). A distance measurement sensor (7) measures the difference between the lengths of the tube (2) and reference member (5), which change as a result of temperature variation. The rate of this displacement of the length difference is greater than that of the displacement of the length of the flight tube (2). Additionally, the length difference is much smaller than the length of the flight tube (2). Therefore, it is possible to recognize deviation resulting from thermal expansion with high accuracy while using an inexpensive sensor such as a strain gauge and use the resulting measured value to correct the m/z values of mass spectrum data and thereby carry out highly accurate mass deviation correction.
Inventors:
YAMAGUCHI SHINICHI (JP)
Application Number:
PCT/JP2015/079253
Publication Date:
April 20, 2017
Filing Date:
October 16, 2015
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
H01J49/40; G01N27/62
Foreign References:
| JPH06229705A | 1994-08-19 | |||
| JP2008511964A | 2008-04-17 | |||
| JP2003068246A | 2003-03-07 | |||
| JP2015072775A | 2015-04-16 |
Attorney, Agent or Firm:
KYOTO INTERNATIONAL PATENT LAW OFFICE (JP)
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