Title:
METHOD FOR DETECTING AND ANALYZING SURFACE FILMS
Document Type and Number:
WIPO Patent Application WO/2016/057990
Kind Code:
A3
Abstract:
Disclosed herein are embodiments of a novel method and system to analyze films using plasma to produce spectral data and analyzing the spectral data. A method of analyzing a film comprising: contacting the film with plasma to produce spectral lines; and analyzing the spectral lines.
More Like This:
| JPS53122471 | FLUORESCENT PHOTOMETRIC MICROSCOPE |
| JP2000249655 | LASER-EXCITAED PLASMA EMISSION SPECTROPHOTOMETER |
| JPH0192628 | GAMMA RAY RESONANCE DISPERSION METHOD |
Inventors:
KATZ JORDAN (US)
BELKIND ABE (US)
CLEVENGER RANDY (US)
BELKIND ABE (US)
CLEVENGER RANDY (US)
Application Number:
PCT/US2015/055102
Publication Date:
August 18, 2016
Filing Date:
October 12, 2015
Export Citation:
Assignee:
ORTHOBOND INC (US)
International Classes:
G01J3/443
Foreign References:
| US20130155404A1 | 2013-06-20 | |||
| US20030090676A1 | 2003-05-15 | |||
| US20080123082A1 | 2008-05-29 | |||
| US20120076922A1 | 2012-03-29 | |||
| US20040022960A1 | 2004-02-05 |
Other References:
See also references of EP 3204741A4
Attorney, Agent or Firm:
PARADISO, Robert, J. et al. (65 Livingston AvenueRoseland, NJ, US)
Download PDF:
Previous Patent: ELECTROMECHANICAL SURGICAL SYSTEM
Next Patent: DIRECTED SELECTION OF PLANT MICROBIOMES
Next Patent: DIRECTED SELECTION OF PLANT MICROBIOMES