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Patent Searching and Data


Title:
METHOD OF DETECTING DEFECT OF GLASS
Document Type and Number:
WIPO Patent Application WO/2003/056315
Kind Code:
A1
Abstract:
A method of detecting the presence of a defect of a cover glass capable of performing the defect inspection of the cover glass by accurately detecting the presence of the defect of the cover glass, characterized by comprising the steps of detecting the intensity of transmitted light by inserting the glass into a Fabry−Perot resonator and reading the presence of the defect of the glass from a variation in the intensity of the transmitted light.

Inventors:
INOUE SHUICHIRO (JP)
Application Number:
PCT/JP2002/013033
Publication Date:
July 10, 2003
Filing Date:
December 12, 2002
Export Citation:
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Assignee:
UNIV SCHOOL NIHON JURIDIC PER (JP)
INOUE SHUICHIRO (JP)
International Classes:
G01N21/958; G02F1/13; G02F1/1333; (IPC1-7): G01N21/958
Foreign References:
JP2001311697A2001-11-09
JPS58193404A1983-11-11
JPH07270308A1995-10-20
Attorney, Agent or Firm:
Asamura, Kiyoshi (New Ohtemachi Bldg. 2-1, Ohtemachi 2-chom, Chiyoda-ku Tokyo, JP)
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