METHOD FOR DETECTING POOR MOUNTING STATE OF MODULE, AND ARRAY

Title:

METHOD FOR DETECTING POOR MOUNTING STATE OF MODULE, AND ARRAY

Document Type and Number:

WIPO Patent Application WO/2019/117189

Kind Code:

A1

Abstract:

This method for detecting a poor mounting state of a module in a light condensing photovoltaic power generating device is configured such that: a surface of an array is imaged by an imaging device; a light receiving unit, including a cell and the vicinity thereof, is represented as a virtual image that has been enlarged by passing through a condensing lens; an image is acquired, the image being formed as a result of a group of pixels of the virtual image becoming a synthetic virtual image of the light receiving unit as a whole, and the image being projected across a plurality of modules; and a poor mounting state of a module is detected on the basis of the configuration of the synthetic virtual image.

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Inventors:

IWASAKI TAKASHI (JP)
MORI KOJI (JP)
SAITO KENJI (JP)
IYATANI KAZUSHI (JP)
KOGETSU YOSHIKAZU (JP)

Application Number:

PCT/JP2018/045630

Publication Date:

June 20, 2019

Filing Date:

December 12, 2018

Export Citation:

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Assignee:

SUMITOMO ELECTRIC INDUSTRIES (JP)

International Classes:

H02S50/00; H01L31/054; H02S20/10; H02S20/32; H02S40/22

Domestic Patent References:

WO2017022325A1	2017-02-09
WO2017006712A1	2017-01-12
WO2012169618A1	2012-12-13

Foreign References:

JP2015185676A	2015-10-22
JP2014127699A	2014-07-07
US9324893B1	2016-04-26
JP2017239388A	2017-12-14
JP2014226025A	2014-12-04

Other References: