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Patent Searching and Data


Title:
METHOD FOR DETERMINING DEFECTS
Document Type and Number:
WIPO Patent Application WO/2019/138704
Kind Code:
A1
Abstract:
Provided is a method for determining defects with which it is possible to easily determine whether working of an article is normal or not. The method for determining defects comprises a good product data acquisition step, a displacement acquisition step, a differential acquisition step, a first calculation step, and a determination step. The good product data acquisition step acquires current waveforms (W1 – Wn) for an article (11) affecting the quality of the article (11) in a welding step for the article (11) and changing over time. The displacement acquisition step acquires a current waveform (Xp) affecting the quality of the article (11) in the welding step for the article (11) and changing over time. The differential acquisition step acquires a differential value (Q) for the current waveform (Xp) for the current waveforms (W1 – Wn) in the welding step at each prescribed time (T1 – Tm). The first calculation step finds a sum (Rp) and a maximum value (Qp(max)). The determination step determines whether the sum (Rp) and the maximum value (Qp(max)) found in the first calculation step are outside of one range (J1), which is a threshold, or not.

Inventors:
NAITO TAKAYOSHI (JP)
NISHIO AKIHIKO (JP)
Application Number:
PCT/JP2018/043428
Publication Date:
July 18, 2019
Filing Date:
November 26, 2018
Export Citation:
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Assignee:
KYB CORP (JP)
International Classes:
B23K31/00; B23K9/095; G05B19/418
Foreign References:
JP2013510725A2013-03-28
JP2002202806A2002-07-19
JP2013089064A2013-05-13
JP2017220176A2017-12-14
JP2016110290A2016-06-20
Attorney, Agent or Firm:
GRANDOM PATENT LAW FIRM (JP)
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