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Patent Searching and Data


Title:
METHOD FOR DETERMINING MICROSTRUCTURE OF ELECTRODE USING ELECTRICAL CONDUCTIVITY
Document Type and Number:
WIPO Patent Application WO/2022/177335
Kind Code:
A1
Abstract:
The present invention relates to a method for determining the microstructure of an electrode using electrical conductivity, the method comprising the steps of: a) preparing a specimen including an electrolyte layer, an electrode layer, and a fine conducting wire; b) connecting an electrical conductivity measuring device to the fine wire of the specimen to measure electrical conductivity according to temperature; and c) determining whether the microstructure of the electrode layer is a porous structure or a dense structure, from the change tendency of the measured electrical conductivity.

Inventors:
KIM JUNG HYUN (KR)
SONG KYEONG EUN (KR)
Application Number:
PCT/KR2022/002395
Publication Date:
August 25, 2022
Filing Date:
February 18, 2022
Export Citation:
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Assignee:
UNIV NAT HANBAT IND ACAD COOP FOUND (KR)
International Classes:
G01N27/30; G01N27/07; G01N27/403
Foreign References:
KR101963980B12019-03-29
KR20050063479A2005-06-28
KR20140061130A2014-05-21
US20090011307A12009-01-08
KR102300201B12021-09-08
Attorney, Agent or Firm:
OAM PATENT & TRADEMARK LAW FIRM (KR)
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