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Patent Searching and Data


Title:
METHOD FOR DETERMINING OFFSET OF WAVE, APPARATUS, DEVICE, AND STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2024/031764
Kind Code:
A1
Abstract:
Provided in the embodiments of the present disclosure are a method for determining the offset of a wave, an apparatus, a device, and a storage medium. The method comprises: acquiring loss data of a wave at a first working temperature; determining whether the loss data satisfies the requirement of a preset index; and, when the loss data satisfies the requirement of the preset index, determining a target offset of the wave at the first working temperature on the basis of the loss data and the preset index. By acquiring the loss data of the wave at the first working temperature and by determining the target offset of the wave at the first working temperature on the basis of the requirement of the preset index corresponding to the loss data, chips are screened according to the target offset, thereby increasing the utilization rate of the chips while ensuring the qualified rate of finished products.

Inventors:
KONG XIANGJIAN (CN)
HU JIAYAN (CN)
ZHANG MUCHAN (CN)
CHEN HONGGANG (CN)
ZHANG BO (CN)
LUO YONG (CN)
MA WEIDONG (CN)
Application Number:
PCT/CN2022/117247
Publication Date:
February 15, 2024
Filing Date:
September 06, 2022
Export Citation:
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Assignee:
ACCELINK TECH CO LTD (CN)
International Classes:
H04B10/077
Domestic Patent References:
WO2018103004A12018-06-14
Foreign References:
CN110350391A2019-10-18
CN109193332A2019-01-11
US6362476B12002-03-26
JP2004361506A2004-12-24
Attorney, Agent or Firm:
ZY PARTNERS (CN)
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