Title:
METHOD FOR DETERMINING STRUCTURE OF SOFT MATERIAL
Document Type and Number:
WIPO Patent Application WO/2001/088515
Kind Code:
A1
Abstract:
A method for determining the three-dimensional structure of a low-density material called a soft material not ordered on an atomic scale but ordered on a mesoscale (20 to 500 angstroms), especially by means of a high-resolution transmission microscope. A soft material is imaged by means of a transmission microscope in three or more directions meaningful in crystallography. The image is Fourier-transformed to calculate the amplitude and phase of the crystal structure factor. Fourier inverse transform using the values is carried out and hence a space group of the soft material is determined.
Inventors:
TERASAKI OSAMU (JP)
OHSUNA TETSU (JP)
OHSUNA TETSU (JP)
Application Number:
PCT/JP2000/008326
Publication Date:
November 22, 2001
Filing Date:
November 27, 2000
Export Citation:
Assignee:
JAPAN SCIENCE & TECH CORP (JP)
TERASAKI OSAMU (JP)
OHSUNA TETSU (JP)
TERASAKI OSAMU (JP)
OHSUNA TETSU (JP)
International Classes:
G01N23/04; (IPC1-7): G01N23/04
Foreign References:
| JP2000065762A | 2000-03-03 | |||
| JPH06249799A | 1994-09-09 |
Other References:
Journal of Electron Microscopy, Vol. 48, No. 6, (07 February, 2000)(Japan), Osamu Terasaki, et al., "The structure of MCM-48 determined by electron crystallography", pages 795-798.
Attorney, Agent or Firm:
Takita, Seiki (7th Floor 41-12 Kabukicho 2-chome Shinjuku-ku, Tokyo, JP)
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