Title:
METHOD AND DEVICE FOR ANALYSING A HIGHLY DYNAMIC WAVEFRONT
Document Type and Number:
WIPO Patent Application WO2000042401
Kind Code:
A3
Abstract:
The invention concerns the analysis of an optical wavefront. The inventive device comprises in particular an array (ML) of micro-lenses (Li), a detector (DET) and signal processing means. Each micro-lens (Li) defines a sub-soft aperture (SPi), and focuses an elementary surface of said wavefront, intercepted by said sub-soft aperture, to form a spot (Ti) on the detector. For each sub-soft aperture (SPi), a zone (Zi) of assumed localisation of the spot is defined. The processing means enable to establish a measurement file associating with each sub-soft aperture the position of said spot. The array structure (ML) has one or several local variations. By comparing the contribution derived therefrom taken from the measurement file, with their contribution derived from a reference file, the shift between the sub-soft aperture wherefrom is derived a detected spot and the sub-soft aperture which defines the assumed localisation zone wherein the spot is located is measured.
Inventors:
LEVECQ XAVIER JEAN-FRANCOIS (FR)
BUCOURT SAMUEL HENRI (FR)
BUCOURT SAMUEL HENRI (FR)
Application Number:
PCT/FR2000/000063
Publication Date:
August 16, 2001
Filing Date:
January 14, 2000
Export Citation:
Assignee:
IMAGINE OPTIC (FR)
LEVECQ XAVIER JEAN FRANCOIS (FR)
BUCOURT SAMUEL HENRI (FR)
LEVECQ XAVIER JEAN FRANCOIS (FR)
BUCOURT SAMUEL HENRI (FR)
International Classes:
G01J9/00; G01M11/00; (IPC1-7): G01J9/00
Foreign References:
| DE19705119A1 | 1998-08-13 |
Other References:
M.C. ROGGEMANN AND T.J. SCHULZ: "Algorithm to increase the largest aberration that can be reconstructed from Hartmann sensor measurements", APPLIED OPTICS, vol. 37, no. 20, 10 July 1998 (1998-07-10), pages 4321 - 4329, XP002112722
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