Title:
METHOD AND DEVICE FOR ANALYZING SPECIFIC AREA OF IMAGE
Document Type and Number:
WIPO Patent Application WO/2021/015490
Kind Code:
A2
Abstract:
A method for analyzing the specific area of an image, according to one embodiment of the present invention, can comprise the steps of: inputting an abnormal image into a first machine learning model, which is trained to generate at least one normal image related to an inputted image, thereby generating a plurality of normal images related to the abnormal image; generating an initial attention map including a specific area representing the difference between the abnormal image and each of the plurality of normal images; and using a second machine learning model trained to remove errors so as to generate a final attention map on the basis of removal of the first attention map that is an error among the initial attention maps.
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Inventors:
KIM NAMKUG (KR)
BAE HYUN-JIN (KR)
SEO JOON BEOM (KR)
LEE SANG MIN (KR)
BAE HYUN-JIN (KR)
SEO JOON BEOM (KR)
LEE SANG MIN (KR)
Application Number:
PCT/KR2020/009398
Publication Date:
January 28, 2021
Filing Date:
July 16, 2020
Export Citation:
Assignee:
UNIV ULSAN FOUND IND COOP (KR)
ASAN FOUND (KR)
ASAN FOUND (KR)
International Classes:
G06T7/00; A61B5/00; A61B6/00; G06N3/04; G06N3/08; G06T7/11; G16H30/40; G16H50/20
Attorney, Agent or Firm:
FIRSTLAW P.C. (KR)
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