METHOD AND DEVICE FOR CHECKING LOW-VOLTAGE DEFECT IN SECONDARY BATTERY

Title:

METHOD AND DEVICE FOR CHECKING LOW-VOLTAGE DEFECT IN SECONDARY BATTERY

Document Type and Number:

WIPO Patent Application WO/2018/128395

Kind Code:

A1

Abstract:

The present invention provides a technology for effectively detecting a low-voltage defect which may be generated in a secondary battery. A method for checking a low-voltage defect in a secondary battery, according to the present invention, may comprise: an assembling step of assembling a secondary battery by loading, into a battery case, an electrode assembly in which a cathode plate and an anode plate are laminated with a separator interposed therebetween, and an electrolyte; a first aging step of aging the assembled secondary battery at a temperature of 20°C to 40°C; a first formation step of charging the aged secondary battery with a C-rate of 0.1C to 0.5C; a high-rate charging step of charging the secondary battery with a C-rate of 2C or more after the first formation step; and a detecting step of detecting a defect in the secondary battery after the high-rate charging step.

Inventors:

KIM SUNG-TAE (KR)
BAE JOON-SUNG (KR)
SUNG NAK-GI (KR)

Application Number:

PCT/KR2018/000135

Publication Date:

July 12, 2018

Filing Date:

January 03, 2018

Export Citation:

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Assignee:

LG CHEMICAL LTD (KR)

International Classes:

G01R31/36; H01M10/04; H01M10/44; H01M10/48

Foreign References:

JP2015153484A	2015-08-24
JP2015015084A	2015-01-22
KR101106359B1	2012-01-18
JPH11250930A	1999-09-17
CN105609889A	2016-05-25

Other References: