Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
METHOD AND DEVICE FOR CORRECTING NON-LINEAR ERRORS OF SINGLE-FREQUENCY LASER INTERFEROMETER
Document Type and Number:
WIPO Patent Application WO/2020/098227
Kind Code:
A1
Abstract:
A method and device for correcting non-linear errors of a single-frequency laser interferometer, which relate to the technical field of laser measurement. The present invention uses a liquid crystal phase retarder to generate a continuous optical path difference variation between a measurement beam and a reference beam without needing to change positions of a first mirror and a second mirror, so that an interference signal generates a sufficient phase change. The pre-extraction of feature parameters of the interference signal is achieved, and thus non-linear errors in a displacement measurement process of the single-frequency laser interferometer are corrected by using the pre-extracted feature parameters so as to achieve high-precision displacement measurement. The present invention achieves the pre-extraction of the feature parameters of the interference signal of the single-frequency laser interferometer, may effectively solve the correction problem of non-linear errors in interference measurements, especially micro-displacement measurements, and has significant technical advantages in the field of precision measurement.

Inventors:
HU PENGCHENG (CN)
FU HAIJIN (CN)
WANG KE (CN)
TAN JIUBIN (CN)
Application Number:
PCT/CN2019/083984
Publication Date:
May 22, 2020
Filing Date:
April 24, 2019
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
HARBIN INST TECHNOLOGY (CN)
International Classes:
G01B9/02; G01B11/02
Foreign References:
CN109539975A2019-03-29
JP2004150965A2004-05-27
CN104748672A2015-07-01
CN106705858A2017-05-24
CN102435136A2012-05-02
Attorney, Agent or Firm:
KINGSOUND & PARTNERS (CN)
Download PDF: