Title:
METHOD AND DEVICE FOR DIAGNOSING REMAINING LIFETIME OF SWITCHGEAR
Document Type and Number:
WIPO Patent Application WO/2010/095259
Kind Code:
A1
Abstract:
A method and device for diagnosing the remaining lifetime of a switchgear. State quantities relating to the deteriorated state of the switchgear estimated on the basis of measured data obtained by the measurement of the operation property of the switchgear are stored as state quantity history data. On the basis of the state quantity history data stored, created are a plurality of pieces of series data wherein the state quantities are arrayed respectively on the axes of an elapsed time during the operating time of the switchgear, the number of operating times of the switchgear, the non-operating time of the switchgear, and the cumulative operating time of the switchgear. On the basis of the series data created, the remaining lifetime of the switchgear is estimated precisely.
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Inventors:
MARUYAMA AKIHIKO (JP)
HORINOUCHI KATSUHIKO (JP)
HORINOUCHI KATSUHIKO (JP)
Application Number:
PCT/JP2009/053164
Publication Date:
August 26, 2010
Filing Date:
February 23, 2009
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
MARUYAMA AKIHIKO (JP)
HORINOUCHI KATSUHIKO (JP)
MARUYAMA AKIHIKO (JP)
HORINOUCHI KATSUHIKO (JP)
International Classes:
G01M99/00; G05B23/02; H02B13/00
Domestic Patent References:
WO2005111641A1 | 2005-11-24 |
Foreign References:
JP2004192441A | 2004-07-08 | |||
JP2004324548A | 2004-11-18 | |||
JPS6118845A | 1986-01-27 | |||
JP2004258703A | 2004-09-16 | |||
JP2009008427A | 2009-01-15 |
Attorney, Agent or Firm:
OIWA, Masuo et al. (JP)
Masuo Oiwa (JP)
Masuo Oiwa (JP)
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