METHOD AND DEVICE FOR MEASURING DIELECTRIC CONSTANT

Title:

METHOD AND DEVICE FOR MEASURING DIELECTRIC CONSTANT

Document Type and Number:

WIPO Patent Application WO/2000/019186

Kind Code:

A1

Abstract:

The sample measuring face of a dielectric resonator (20) is placed near a standard sample having a known dielectric constant at a fixed interval D. While appropriately varying the dielectric constant and thickness of the standard sample under the above condition, the variation of the resonance frequency of the dielectric resonator (20) is measured for each varied dielectric constant and thickness to draw a calibration curve of the varied resonance frequency depending on the dielectric constant and thickness. Under the same condition where the calibration curve is drawn, the variation of the resonance frequency of the dielectric resonator (20) for a sample having a known thickness is measured. The dielectric constant of the sample is found from the measurement values and the calibration curve. The dielectric constant of not only a sheetlike sample, but also a three-dimensional molded article or a liquid sample can be measured easily.

Inventors:

NAGATA SHINICHI (JP)
MIYAMATO SEIICHI (JP)
OKADA FUMIAKI (JP)

Application Number:

PCT/JP1999/005234

Publication Date:

April 06, 2000

Filing Date:

September 27, 1999

Export Citation:

Click for automatic bibliography generation Help

Assignee:

OJI PAPER CO (JP)
NAGATA SHINICHI (JP)
MIYAMATO SEIICHI (JP)
OKADA FUMIAKI (JP)

International Classes:

G01N22/00; G01R27/26; (IPC1-7): G01N22/00

Foreign References:

JPH02272349A	1990-11-07
JPS4911195A	1974-01-31
JPH07225200A	1995-08-22
JPH10507263A	1998-07-14
JPH07103917A	1995-04-21
JPS5640787B2	1981-09-24
JPS5752534B2	1982-11-08
JPS536091A	1978-01-20
JPH10325811A	1998-12-08

Other References: