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Title:
METHOD AND DEVICE FOR MEASURING FLUORESCENCE LIFETIME
Document Type and Number:
WIPO Patent Application WO/2019/178794
Kind Code:
A1
Abstract:
A method for measuring fluorescence lifetime, comprising: firstly, taking each row of a preset measurement matrix as a sampling mode, taking a non-zero value position in the each sampling mode as a sparse signal channel for time-gating delay sampling, performing delay sampling on a sample in each sampling mode, accumulating photon numbers of the sparse signal channel in the current sampling mode together to obtain a compressed sensing measurement value, and repeating the each sampling mode to obtain a series of compressed sensing measurement values; then, solving an equation under a l 1 norm optimization algorithm by utilizing the compressed sensing measurement values and combining the measurement matrix to obtain a sparse coefficient; and finally, performing signal reconstruction by applying the inverse transformation of a known sparse matrix to the sparse coefficient to obtain a fluorescence lifetime decay curve so as to realize measurement of the fluorescence lifetime. The method improves the measurement speed of the fluorescence lifetime. Further provided is a device for measuring fluorescence lifetime using the described method.

Inventors:
QU, Junle (Nanhai Ave. 3688, NanshanShenzhen, Guangdong 0, 518060, CN)
CHEN, Bingling (Nanhai Ave. 3688, NanshanShenzhen, Guangdong 0, 518060, CN)
YAN, Wei (Nanhai Ave. 3688, NanshanShenzhen, Guangdong 0, 518060, CN)
LIN, Danying (Nanhai Ave. 3688, NanshanShenzhen, Guangdong 0, 518060, CN)
Application Number:
CN2018/079924
Publication Date:
September 26, 2019
Filing Date:
March 22, 2018
Export Citation:
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Assignee:
SHENZHEN UNIVERSITY (Nanhai Ave. 3688, NanshanShenzhen, Guangdong 0, 518060, CN)
International Classes:
G01N21/64
Foreign References:
CN103090971A2013-05-08
CN101893552A2010-11-24
CN102353449A2012-02-15
CN106952233A2017-07-14
US20170254750A12017-09-07
Attorney, Agent or Firm:
HENSEN INTELLECTUAL PROPERTY FIRM (10H Shangbu Building, No.68 Nanyuan Road Futia, Shenzhen Guangdong 0, 518000, CN)
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