Title:
METHOD AND DEVICE FOR TESTING FOR LEAK IN IODINE FILTER
Document Type and Number:
WIPO Patent Application WO/2011/142243
Kind Code:
A1
Abstract:
Disclosed is a device (10) for testing for a leak in an iodine filter, which comprises: an iodine adsorption part (14) which is disposed inside a chamber (13) of a duct (12) for feeding an exhaust gas (11) containing radioactive iodine, and which is provided with an iodine filter (20) comprising an iodine adsorbent (24) that adsorbs the radioactive iodine contained in the exhaust gas (11); a fluorine-containing reagent feed part (15) for feeding a chlorine-free fluorine-containing reagent (30) to inside the duct (12); and a first fluorine-containing reagent concentration measurement part (16) and a second fluorine-containing reagent concentration measurement part (17) which are disposed at the upstream side of the iodine filter (20) and measure the concentration of the fluorine-containing reagent (30) at the upstream side and the downstream side of the iodine filter (20).
Inventors:
MORI, Norihisa (())
森 宣久 (())
森 宣久 (())
Application Number:
JP2011/060080
Publication Date:
November 17, 2011
Filing Date:
April 25, 2011
Export Citation:
Assignee:
MITSUBISHI HEAVY INDUSTRIES, LTD. (16-5, Konan 2-chome Minato-k, Tokyo 15, 〒1088215, JP)
三菱重工業株式会社 (〒15 東京都港区港南二丁目１６番５号 Tokyo, 〒1088215, JP)
MORI, Norihisa (())
三菱重工業株式会社 (〒15 東京都港区港南二丁目１６番５号 Tokyo, 〒1088215, JP)
MORI, Norihisa (())
International Classes:
G21F9/02; G01M3/04; G21D3/00; B01J20/18; B01J20/20
Attorney, Agent or Firm:
SAKAI, Hiroaki et al. (Sakai International Patent Office, Kasumigaseki Building 2-5, Kasumigaseki 3-chome, Chiyoda-k, Tokyo 20, 〒1006020, JP)
Claims: