METHOD AND DEVICE FOR TESTING SEMICONDUCTOR MEMORY DEVICES

Title:

METHOD AND DEVICE FOR TESTING SEMICONDUCTOR MEMORY DEVICES

Document Type and Number:

WIPO Patent Application WO2003021604

Kind Code:

A3

Abstract:

The invention relates to a test method for testing, on a testing device (PA), semiconductor devices (P) that have a bi-directional data strobe link for a data strobe signal (DQS) whereby the data strobe signal is tested by transferring data between the semiconductor memory device (P) to be tested and a second semiconductor memory device of the same type (R). The invention also relates to a device for carrying out the inventive method.

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Inventors:

CORDES ERIC (DE)
EGGERS GEORG ERHARD (DE)
LUEPKE JENS (DE)
STOCKEN CHRISTIAN (DE)

Application Number:

PCT/DE2002/003058

Publication Date:

August 14, 2003

Filing Date:

August 21, 2002

Export Citation:

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Assignee:

INFINEON TECHNOLOGIES AG (DE)
CORDES ERIC (DE)
EGGERS GEORG ERHARD (DE)
LUEPKE JENS (DE)
STOCKEN CHRISTIAN (DE)

International Classes:

G01R31/28; G11C7/10; G11C11/401; G11C29/50; G11C29/56; (IPC1-7): G11C29/00

Domestic Patent References:

WO2002039459A2

2002-05-16

Foreign References:

US6195616B1

2001-02-27

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