Title:
METHOD AND DEVICE FOR A THERMOANALYTICAL MATERIAL ANALYSIS
Document Type and Number:
WIPO Patent Application WO2005003992
Kind Code:
B1
Abstract:
The invention relates to a material analysis method, according to which a material is subjected to a stimulus and the corresponding response is observed. To carry out the evaluation, the parameters of a mathematical model, which emulates the correlation between the stimulus and the response, are determined and the defining material characteristics are subsequently calculated from the time series of estimated values of the model. The invention also relates to a device for carrying out said method, comprising an arithmetic unit, in which a mathematical model with a finite number of parameters is defined. Said model also delivers the values that are the deciding factor for a facility that calculates material characteristics.
Inventors:
HUETTER THOMAS (CH)
HEITZ CHRISTOPH (CH)
SCHAWE JUERGEN (CH)
HEITZ CHRISTOPH (CH)
SCHAWE JUERGEN (CH)
Application Number:
PCT/EP2004/051335
Publication Date:
May 26, 2005
Filing Date:
July 02, 2004
Export Citation:
Assignee:
METTLER TOLEDO GMBH (CH)
HUETTER THOMAS (CH)
HEITZ CHRISTOPH (CH)
SCHAWE JUERGEN (CH)
HUETTER THOMAS (CH)
HEITZ CHRISTOPH (CH)
SCHAWE JUERGEN (CH)
International Classes:
G01D1/00; G01N25/48; (IPC1-7): G06F17/00; G01N25/48
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