Title:
METHOD, DISPLAY DEVICE, AND DEVICE FOR MEASURING SHUTTER TIME LAG; METHOD FOR MANUFACTURING CAMERA; METHOD FOR MEASURING CAMERA DISPLAY DELAY; AND DEVICE FOR MEASURING DISPLAY DELAY
Document Type and Number:
WIPO Patent Application WO/2014/057654
Kind Code:
A1
Abstract:
The present invention facilitates measuring shutter time lag in a camera. The display elements of a display unit are formed into an m
th display pattern by placing j display elements in a first display state and placing the remaining display elements in a second display state darker than the first display state. After the passage of a prescribed time, the display elements of the display unit are switched to an (m+1)th display pattern by causing k display elements of the j display elements in the first display state to be placed in a second display state and causing k display elements of the remaining display elements in the second display state to be placed in the first display state. The camera captures an image of the display unit during sequential execution of the switching action in accordance with a shutter operation carried out in the camera in synchronization with the switching action. The shutter time lag is derived on the basis of the image captured by the camera.
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Inventors:
SHIOHARA RYUICHI (JP)
ICHIKAWA TATSUYA (JP)
ICHIKAWA TATSUYA (JP)
Application Number:
PCT/JP2013/005980
Publication Date:
April 17, 2014
Filing Date:
October 08, 2013
Export Citation:
Assignee:
SEIKO EPSON CORP (JP)
International Classes:
G03B15/00; G03B7/091; G03B17/02; G03B17/38; H04N5/222; H04N5/225
Foreign References:
| JP2010206520A | 2010-09-16 | |||
| JP2002290979A | 2002-10-04 |
Other References:
See also references of EP 2908173A4
Attorney, Agent or Firm:
KAMIYANAGI, Masataka et al. (JP)
Masaaki Kamiyanagi (JP)
Masaaki Kamiyanagi (JP)
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