Title:
METHOD AND ELECTRONIC DEVICE FOR DETERMINING OPTIMAL GLOBAL ATTENTION IN DEEP LEARNING MODEL
Document Type and Number:
WIPO Patent Application WO/2023/211248
Kind Code:
A1
Abstract:
An electronic device for determining global attention in a deep learning model is provided. The electronic device includes a hardware accelerator, a low-complex global attention generator, a parallel switch, and a series switch. The hardware accelerator is configured to process each tile of a full-frame image and the low complex global attention generator is configured to generate a channel attention map of the full-frame image. The parallel switch is configured to bypass a connection of the channel attention map with the hardware accelerator and a series switch, configured to gate the connection of the channel attention map with the hardware accelerator.
Inventors:
RAJ EEGA REVANTH (IN)
PENTAPATI SAI KARTHIKEY (IN)
GADDE RAJ NARAYANA (IN)
GUPTA ANUSHKA (IN)
KIM DONGKYU (KR)
CHOI KWANGPYO (KR)
PENTAPATI SAI KARTHIKEY (IN)
GADDE RAJ NARAYANA (IN)
GUPTA ANUSHKA (IN)
KIM DONGKYU (KR)
CHOI KWANGPYO (KR)
Application Number:
PCT/KR2023/005875
Publication Date:
November 02, 2023
Filing Date:
April 28, 2023
Export Citation:
Assignee:
SAMSUNG ELECTRONICS CO LTD (KR)
International Classes:
G06N3/063; G06F17/15; G06N3/0464; G06N3/08
Foreign References:
| CN113298091A | 2021-08-24 | |||
| CN112465790A | 2021-03-09 | |||
| CN110717856A | 2020-01-21 |
Other References:
BASAK HRITAM, KUNDU ROHIT, AGARWAL ANISH, GIRI SHREYA: "Single Image Super-Resolution using Residual Channel Attention Network", 2020 IEEE 15TH INTERNATIONAL CONFERENCE ON INDUSTRIAL AND INFORMATION SYSTEMS (ICIIS), IEEE, 26 November 2020 (2020-11-26) - 28 November 2020 (2020-11-28), pages 219 - 224, XP093104782, ISBN: 978-1-7281-8524-8, DOI: 10.1109/ICIIS51140.2020.9342688
AN JUNKANG, JOE INWHEE: "Attention Map-Guided Visual Explanations for Deep Neural Networks", APPLIED SCIENCES, vol. 12, no. 8, pages 3846, XP093104780, DOI: 10.3390/app12083846
AN JUNKANG, JOE INWHEE: "Attention Map-Guided Visual Explanations for Deep Neural Networks", APPLIED SCIENCES, vol. 12, no. 8, pages 3846, XP093104780, DOI: 10.3390/app12083846
Attorney, Agent or Firm:
Y.P.LEE, MOCK & PARTNERS (KR)
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