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Title:
METHOD OF ESTIMATING SECONDARY STRUCTURE IN RNA AND PROGRAM AND APPARATUS THEREFOR
Document Type and Number:
WIPO Patent Application WO/2008/072713
Kind Code:
A1
Abstract:
Supposing a frame (F) having a definite short length (L2) on a transcript, the frame (F) is shifted finely stepwise at constant intervals (t). Thus, the structures in the individual micro sections are successively analyzed and the first probability in a specific secondary structure at a specific position in each micro section is determined. Next, one or more specific positions clarified in the individual micro sections are correspondingly located on the original transcript and the degree of the overlap between the individual specific positions is referred to as the second probability. By paying attention to these two probabilities, it can be estimated at an elevated reliability whether or not a desired secondary structure occurs in practice in an RNA such as an mRNA.

Inventors:
NAKAMURA, Shingo (10 Wadai, Tsukuba-sh, Ibaraki 93, 3004293, JP)
Application Number:
JP2007/074063
Publication Date:
June 19, 2008
Filing Date:
December 13, 2007
Export Citation:
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Assignee:
TAKEDA PHARMACEUTICAL COMPANY LIMITED (1-1 Doshomachi 4-chome, Chuo-ku Osaka-sh, Osaka 45, 5410045, JP)
武田薬品工業株式会社 (〒45 大阪府大阪市中央区道修町四丁目1番1号 Osaka, 5410045, JP)
International Classes:
G06F19/16; G06Q50/00; C12N15/09; G06F19/26
Attorney, Agent or Firm:
TAKASHIMA, Hajime (Meiji Yasuda Seimei Osaka Midosuji Bldg, 1-1 Fushimimachi 4-chome, Chuo-ku, Osaka-sh, Osaka 44, 5410044, JP)
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