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Patent Searching and Data


Title:
METHOD FOR EVALUATING ARC-RESISTANCE AND ARC-RESISTANCE EVALUATION DEVICE
Document Type and Number:
WIPO Patent Application WO/2014/203692
Kind Code:
A1
Abstract:
An arc-resistance evaluation device is provided with a plasma generator for generating plasma; and a stand whereon a sheet-like test piece is mounted so that the plasma generated by the plasma generator is irradiated onto the front surface of the test piece. The stand is provided with a temperature measurement device for measuring the temperature on the rear surface of the test piece.

Inventors:
TANAKA YASUNORI (JP)
ISHIDA MASAHIRO (JP)
HAGI HIROYASU (JP)
MIZOBUCHI ATSUSHI (JP)
Application Number:
PCT/JP2014/063999
Publication Date:
December 24, 2014
Filing Date:
May 27, 2014
Export Citation:
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Assignee:
KANEKA CORP (JP)
International Classes:
H05H1/30; G01N25/18; H05H1/00
Foreign References:
JP2003244811A2003-08-29
JP2010225308A2010-10-07
Attorney, Agent or Firm:
UNIUS PATENT ATTORNEYS OFFICE (JP)
Patent business corporation ユニアス international patent firm (JP)
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