Title:
METHOD FOR EVALUATING PHYSICAL STRUCTURE
Document Type and Number:
WIPO Patent Application WO/2017/221846
Kind Code:
A1
Abstract:
The present invention provides an analysis method whereby differences in the physical structure of a sample as a whole can be inexpensively and rapidly evaluated with high sensitivity for each component regardless of the layer structure and the number of constituent components of the sample, and a plurality of factors can be evaluated at once. The analysis method pertaining to an embodiment of the present invention includes an evaluation step for evaluating the physical structure of a sample on the basis of ionization behavior of the sample obtained by MALDI-TOF MS.
Inventors:
IMANISHI KATSUYA (JP)
HIROTA KAZUTOSHI (JP)
HIROTA KAZUTOSHI (JP)
Application Number:
PCT/JP2017/022392
Publication Date:
December 28, 2017
Filing Date:
June 16, 2017
Export Citation:
Assignee:
SUMIKA CHEMICAL ANALYSIS SERVICE LTD (JP)
International Classes:
G01N27/62
Foreign References:
| JPH10189585A | 1998-07-21 | |||
| JP2009264738A | 2009-11-12 | |||
| JP2007524810A | 2007-08-30 | |||
| JP2011074037A | 2011-04-14 |
Other References:
TAKAYA SATO: "JMS-S3000 SpiralTOF o mochiita laser datsuri Ion-ka ho ni yuki hakumaku bunseki", NIPPON DENSHI NEWS, vol. 46, no. 1, 2014, pages 53 - 58
Attorney, Agent or Firm:
HARAKENZO WORLD PATENT & TRADEMARK (JP)
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