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Patent Searching and Data


Title:
METHOD FOR EXTRACTING A CHARGED PARTICLE BEAM USING PULSE VOLTAGE
Document Type and Number:
WIPO Patent Application WO/2011/019036
Kind Code:
A1
Abstract:
Disclosed is a method for extracting a charged particle beam, in which pulse voltage is used to extract a charged particle beam in a rapid and stable fashion, wherein the intensity of the extracted charged particle beam is made uniform, and precise control of the amount of irradiation is made possible. A charged particle beam is accelerated in a circular accelerator, and momentum deviation of only part of the charged particle beam is generated by applying pulse voltage to part of the accelerated charged particle beam. Some of the charged particles, which have large momentum deviation in phase space in the horizontal direction with respect to the travelling direction of the charged particle beam, are positioned in the unstable region/extraction region, and this group of charged particles positioned in the unstable region/extraction region are extracted by selectively imparting thereto a large deflection in the horizontal direction.

Inventors:
TORIKAI KOTA (JP)
YAMADA SATORU (JP)
Application Number:
PCT/JP2010/063566
Publication Date:
February 17, 2011
Filing Date:
August 10, 2010
Export Citation:
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Assignee:
UNIV GUNMA NAT UNIV CORP (JP)
TORIKAI KOTA (JP)
YAMADA SATORU (JP)
International Classes:
H05H13/04; H05H7/10
Foreign References:
JPH05198397A1993-08-06
JPH05109499A1993-04-30
JP2008071494A2008-03-27
JPH0935899A1997-02-07
JP2006310013A2006-11-09
JP2007165220A2007-06-28
JPH0935899A1997-02-07
JP2006310013A2006-11-09
JP2007018756A2007-01-25
JP2007018849A2007-01-25
JP2007018757A2007-01-25
JP2007165220A2007-06-28
Other References:
See also references of EP 2466997A4
Attorney, Agent or Firm:
NAKAGAWA, KUNIO (JP)
Kunio Nakagawa (JP)
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