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Title:
METHOD FOR FORMING IMPURITY-INTRODUCED LAYER, METHOD FOR CLEANING OBJECT TO BE PROCESSED, APPARATUS FOR INTRODUCING IMPURITY AND METHOD FOR PRODUCING DEVICE
Document Type and Number:
WIPO Patent Application WO/2005/020306
Kind Code:
A1
Abstract:
A method for forming an impurity-introduced layer is disclosed which at least comprises a step for forming a resist pattern on one major surface of a solid base such as a silicon substrate (S27), a step for introducing impurities into the solid base through plasma doping in the ion mode (S23), a step for removing the resist (S28), a step for cleaning the solid base surface by removing metal contamination and particles (S25a), and a step for performing a heat treatment (S26). The resist removing step (S28) is performed by irradiating the resist with an oxygen plasma (S28a) or by bringing the resist into contact with a mixed solution of sulfuric acid and hydrogen peroxide solution or a mixed solution of NH4OH, H2O2 and H2O. The cleaning step (S25a) is performed by bringing the major surface of the solid base into contact with a mixed solution of sulfuric acid and hydrogen peroxide solution or a mixed solution of NH4OH, H2O2 and H2O. The resist removing step (S28) and the cleaning step (S25a) are performed at the same time by bringing the resist and the major surface of the solid base into contact with a mixed solution of sulfuric acid and hydrogen peroxide solution or a mixed solution of NH4OH, H2O2 and H2O at onece.

Inventors:
SASAKI YUICHIRO
OKASHITA KATSUMI
MIZUNO BUNJI
ITO HIROYUKI
JIN CHENG-GUO
TAMURA HIDEKI
NAKAYAMA ICHIRO
OKUMURA TOMOHIRO
MAESHIMA SATOSHI
Application Number:
PCT/JP2004/012583
Publication Date:
March 03, 2005
Filing Date:
August 25, 2004
Export Citation:
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Assignee:
MATSUSHITA ELECTRIC IND CO LTD (JP)
SASAKI YUICHIRO
OKASHITA KATSUMI
MIZUNO BUNJI
ITO HIROYUKI
JIN CHENG-GUO
TAMURA HIDEKI
NAKAYAMA ICHIRO
OKUMURA TOMOHIRO
MAESHIMA SATOSHI
International Classes:
F01N11/00; F02B37/18; F02B39/16; F02D23/00; F02D41/00; H01L21/02; H01L21/223; H01L21/265; H01L21/304; (IPC1-7): H01L21/265; H01L21/304
Domestic Patent References:
WO2002067333A12002-08-29
Foreign References:
JPH1131665A1999-02-02
JP2003077856A2003-03-14
JP2001007220A2001-01-12
JPH09199719A1997-07-31
JP2000349039A2000-12-15
JPH11340424A1999-12-10
JP2000495814A
JPH11274492A1999-10-08
JPH08213339A1996-08-20
JPH02295114A1990-12-06
JPH03255622A1991-11-14
JPH05314944A1993-11-26
JPH0992804A1997-04-04
Attorney, Agent or Firm:
Iwahashi, Fumio c/o Matsushita Electric Industrial Co. Ltd. (1006, Oaza Kadom, Kadoma-shi Osaka 01, JP)
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