SUBSTRATE

BACKGROUND AND SUMMARY OF THE INVENTION

The invention relates generally to a method of making a shallow junction in semiconductor substrate and in particular an uncontaminated shallow junction.

A surface passivation shallow junction is necessary in back illuminated Cmos image sensor to limit losses of short wavelength signal.

Shallow junction in a semiconductor substrate, such as a silicon wafer, is typically realized as shown in Figure 1A by first bombarding a surface of the semiconductor substrate 1 with ions at low energy to limit the dopant 5 penetration and create a shallow ion implanted region 4 and thereafter submitting the semiconductor substrate to a melting laser annealing treatment to fully activate and diffuse the dopants 5.

An atomic oxygen-based interface layer 2 is always present at the interface air/substrate before laser annealing treatment.

The oxidation problem can be solved by removing the oxygen-based interface layer and depositing a capping layer on the substrate surface. However, independently from the material and the deposition technique, an atomic interface layer 2 with low melting temperature containing contaminants other than oxygen is always present. (See Y. Liao and al., Applied Physics A: Materials Science, vol. 82, 679-682, (2006).

Melting laser annealing treatment induces extremely high surface temperatures on the substrate (more than 1400°C to melt silicon). At such very high temperature, the interface layer 2 is always molten and diffuses inside the molten substrate.

Diffusion depth depends on the atomic elements 3 (contaminants) in the interface layer 2, then diffusion coefficients in the substrate liquid phase, and the substrate melting time. Contaminants, particularly oxygen, can drastically decrease the quality of the substrate lattice. (See Vanhellemont J.; Simoen E.; Kaniava A. ; Libezny M.; Claeys C; "Impact of oxygen related extended defects on silicon diode characteristics", Journal of Applied Physics, vol. 77, n° 1 1 , pp. 5669, 5676, Jun. 1995).

This problem is crucial regarding back illuminated Cmos image sensors (BSI-CIS) which are strongly sensible to the lattice quality.

Although the present description will mainly refer to oxygen as the contaminant and silicon as semiconductor substrate material, it concerns all contaminants that can be present in the interface layer 2 and diffuse in the semiconductor substrate during the melting laser annealing treatment, as well as to other semiconductor substrate material, such as for example Ge and SiGe. Other contaminants are, for instance, nitrogen and carbon.

The problem of oxygen incorporation within the substrate during melting laser annealing treatment is well known and has been extensively studied for amorphous to poly-Si recrystallization. (See Koichito Hoh, Hiroshi Koyama, Keiichiro Udal and Yoshio Miura "Incorporation of Oxygen into Silicon during Pulsed-Laser Irradiation" Jpn J. Appl. Phys. 19 (1980), pp. L375-L378)

Some solutions have already been suggested.

For examples, US patent N° 6,071 ,796 proposes to control oxygen content by directing inert gas onto the surface of the silicon film during irradiation of the target region. However, this solution is not very efficient and somewhat difficult to implement.

Other solutions are directed to totally different processes which do not use ion implantation and laser annealing treatment. See, for example, US Patent Application n° 2009/0230496A1 .

Thus, the aim of the present invention is to provide a method for forming a shallow junction in a semiconductor substrate, using ion implantation and melting laser annealing treatment which is almost free of contaminants.

According to the invention, there is provided a method for forming a shallow junction in a semiconductor substrate having an interface layer on a first surface of said substrate, comprising the steps of:

a) bombarding said first face with ions so as to implant ions into said semiconductor substrate and to form an ion implanted region having a predetermined implantation depth; and

b) irradiating said first face with a pulsed laser beam to melt said semiconductor substrate to at least the predetermined implantation depth;

characterized in that:

- said pulsed laser beam has an energy density and a pulse duration selected to form within said ion implanted region a first layer extending from the first face and including implanted ions and contaminants having diffused from said interface layer, and a second layer extending from the first layer deeper into the semiconductor substrate and including implanted ions and contaminants in an atomic concentration of contaminants/ lower than 10 ¹⁸ at/cm ³ , preferably lower than 10 ¹⁷ at/cm ³ and in that:

- it further comprises a step c) of removing at least said first layer from the semiconductor substrate, said junction being formed at the interface between said second layer and a subjacent non-molten part of the semiconductor substrate.

In further specific embodiments, the method of the invention comprises alone or in combination the following features:

- step c) comprises removing a part of the second layer;

- step c) is a final step of chemical-mechanical polishing;

- step c) is a wet etching step.

In a preferred embodiment of the invention, the method for forming the shallow junction comprises, before step a):

- a step of raw grinding of the first face of the semiconductor substrate, and then

- an initial step of chemical-mechanical polishing of the first face.

BRIEF DESCRIPTION OF THE DRAWINGS

Figure 1A is a schematic drawing of prior art method for forming a shallow junction using ion implantation and melting laser annealing treatment;

Figure 1 B is a schematic drawing of the method of the invention; and Figure 2 are graphs of the atomic concentration of contaminants (oxygen) and implanted ions (boron) in function of the depth in the substrate as determined by Secondary Ion Mass Spectroscopy (SIMS).

DETAILED DESCRIPTION AND PREFERRED EMBODIMENT

Figure 1 B is a schematic illustration of the method of the invention.

The semiconductor substrate 1 , for example a silicon wafer, having a first surface 1 a covered with an interface layer 2 containing contaminants 3, usually an atomic oxygen-based interface layer is submitted to an ion bombardment (for example boron ions) through its first face to form within the semiconductor substrate 1 under the first face 1 a, an ion implanted region 4 containing dopants 5.

The ion implantation step can be any classical ion implantation method generally used in the technical field. Reference can be made to "Ziegler, James F., ed. Ion Implantation Science and Technology 2e. Elsevier, 2012."

However, according to the present invention, the ion implantation parameters are selected to preferably obtain a predetermined ion implantation depth which is greater than the expected diffusion depth of the contaminants within the semiconductor substrate during the subsequent melting laser annealing treatment.

Thus, for instance, by using an UV excimer laser (Energy density: 3 J/cm ² ;pulse duration 160 ns) to melt a silicon wafer to a 350 nm depth from the wafer surface, oxygen diffusion is observed up to 250 nm. Therefore, implanting ions deeper than 250 nm and up to 350 nm will leave an ion implanted and activated oxygen free layer available between 250 nm and 350 nm.

Typically, the ion implantation energy is in the interval [1 ; 100keV].

Thereafter, the semiconductor substrate 1 is subjected through its first face 1 a to a melting laser thermal annealing treatment, using a pulsed laser beam, to diffuse and activate the ion dopants.

According to the invention, the pulsed laser beam energy density and the pulse duration are selected so that the melting laser annealing treatment forms within the ion implanted region 4 a first layer 6 extending from the first face 1 within the ion implanted region 4 which includes implanted ions 5 and contaminants 3 having diffused from interface layer 2 and a second layer 7 extending from the first layer 6 deeper within the semiconductor substrate and including implanted ions 5 and contaminants 3 wherein the atomic ratio "contaminants/implanted ions" is lower than a predetermined threshold.

Typically, the energy density of the pulsed laser beam is in the interval [0.1 to 10 J/cm ² ] preferably [1 to 10 J/cm ² ] and even better [1 to 5 J/cm ² ] and the pulse duration is in the interval [1 to 200 ns], preferably [120-180ns].

Of course, the atomic concentration of contaminants in the second layer 7 or at least in deeper portion of second layer 7 shall be low.

Typically, the atomic concentration of contaminants in second layer 7 is lower than 10 ¹⁸ at /cm ³ preferably lower than 0.5 10 ¹⁸ at /cm ³ , even better lower than 10 ¹⁷ at / cm ³ _.

Atomic concentrations are determined by Secondary Ion Mass Spectroscopy (SIMS).

Following the melting layer annealing treatment, at least the first layer 6 is removed so that a shallow junction is formed at the interface between the second layer 7 and the subjacent non-molten part of the semiconductor substrate 1 .

In some embodiments, a portion of the second layer 7 may also be removed in order to achieve the requested contaminants concentration within the ion implanted area.

Removal of the first layer 6 and possibly of a portion of the second layer 7 can be effected using any known removal method such as known mechanical and chemical methods or a combination thereof. Removal can also be effected by thermal oxidation and then selective etching of the oxide. After removal, the second layer has usually a thickness in the interval [10 nm; 1 μιη]; preferably equal to or lower than 10Onm.

Typically, the first layer 6 removal is a final step of chemical/mechanical polishing or a wet etching step.

Several possible technics can be used:

1 ) Purely wet chemical etching:

This is a well known etching technic using KOH or TMAH. KOH is potassium hydroxide. TMAH stands for Tetramethyl ammonium hydroxide. Both compounds are commonly used for etching silicon, [KNOTTER, D. M. (2010) THE CHEMISTRY OF

WET ETCHING, IN HANDBOOK OF CLEANING IN SEMICONDUCTOR MANUFACTURING: FUNDAMENTAL AND APPLICATIONS (EDS K. A. REINHARDT AND R. F. REIDY), JOHN WILEY & SONS, INC., HOBOKEN, NJ, USA. DOi: 10.1002/9781 118071748.CH3]

2) Dry etching [NOJIRI. KAZUO. DRY ETCHING TECHNOLOGY FOR SEMICONDUCTORS. SPRINGER, 2014.]:

a. Reactive Ion Etching (RIE):

This is a plasma etching technology. During RIE etching processes, volatile compounds are formed in interaction of sample surfaces and high-energy ions/radicals generated by low-pressure plasma. The volatile compounds are removed from the sample surfaces, and isotropic or anisotropic profile is achieved. SF6 is often use for etching Si;

B. DIRECT PLASMA: High-energy ions are sputtered on the surface to remove the layer.

3) Chemical mechanical polishing [Oliver, Michael R., ed. Chemical-mechanical planarization of semiconductor materials. Vol. 69. Springer Science & Business Media, 2013.] : - A physical removal of the layer by a soft grinding assisted by chemistry (to control the removed thickness and avoid important defects).

4) Thermal oxidation [Declerck, G. J., Silicon Oxidation - Microelectronic Materials and Processes (1989) Springer Pages 79--

132, 978-94-009-0917-5]:

- Layer can be thermally oxidized. The oxide layer formed can be maintained (inactive) or easily chemically etched (i.e. with HF solutions).

All these processes are well known in the art

Chemical/mechanical polishing initial step can be implemented as disclosed above.

Example:

Silicon wafers having the characteristics given below are treated according to the invention as indicated hereinunder.

1 ) Silicon wafer characteristics:

Silicon epitaxially grown on standard Czochralski (CZ) wafers.

The silicon epitaxially grown wafer is well known to achieve a better level of purity (oxygen contamination « 10 ¹⁷ at/cm ³ ) than a standard CZ wafer (oxygen contamination < 10 ¹⁸ at/cm ³ ).

2) Implantation

Apparatus Implanted Ions Implantation Parameters

Medium current ion B Energy 30 keV implantation system Implanted dose

10 ¹⁵ at/cm ³ Tilt angle 7°

3) Pulsed laser beam treatment

Irradiation parameters

Apparatus Energy density Pulse duration UV examer laser 3/3.5/4 J/cm ² 160 ns λ = 308 nm

After the pulse laser beam treatment, the atomic concentrations of both oxygen and boron in the wafer has been determined by SIMS.

Also, oxygen and boron atomic concentrations of a silicon wafer subjected to same ion implantation but no pulsed laser beam treatment have been determined.

Results are shown in Figure 2.

Figure 2 clearly shows that the method of the invention results in a first layer up to 250 nm depth having significant atomic concentration of oxygen and a second layer from 250 nm to 350 nm depth with much lower atomic concentration of oxygen while the atomic boron concentration remains almost stable.

4) The obtained silicon wafers are then subjected to a chemical/mechanical polishing to obtain the final product.

Removing 250 to 350 nm by chemical/mechanical polishing will form an uncontaminated junction of 10 to 150 nm. For example, using laser annealing at 3.5 J/cm ² , removing 300 nm by chemical/mechanical polishing will form an uncontaminated junction of 100nm.