METHOD FOR INSPECTING AND METHOD FOR ANALYZING ORGANIC ELECTRONIC DEVICE, AND USE THEREFOR

Title:

METHOD FOR INSPECTING AND METHOD FOR ANALYZING ORGANIC ELECTRONIC DEVICE, AND USE THEREFOR

Document Type and Number:

WIPO Patent Application WO/2017/195816

Kind Code:

A1

Abstract:

Provided is an inspection method for non-destructively detecting the location of an abnormality generated by electrical operation of an organic electronic device. The inspection method pertaining to the present invention includes a detection step for detecting the location of an abnormality generated by electrical operation of an organic electronic device by evaluating, using an optical method, a defect in the organic electronic device in a state in which electrical operation is not performed.

Inventors:

IMANISHI KATSUYA (JP)
OHMORI MIHO (JP)

Application Number:

PCT/JP2017/017663

Publication Date:

November 16, 2017

Filing Date:

May 10, 2017

Export Citation:

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Assignee:

SUMIKA CHEMICAL ANALYSIS SERVICE LTD (JP)

International Classes:

H05B33/12; H01L21/66; H01L51/50

Foreign References:

JP2016071988A	2016-05-09
JP2009063711A	2009-03-26
JP2004172127A	2004-06-17
JP2013251224A	2013-12-12
JPH10172768A	1998-06-26
JP2005214962A	2005-08-11

Attorney, Agent or Firm:

HARAKENZO WORLD PATENT & TRADEMARK (JP)

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