METHOD OF INSPECTING FOREIGN OBJECT AND LIGHTING INSPECTION DEVICE

Title:

METHOD OF INSPECTING FOREIGN OBJECT AND LIGHTING INSPECTION DEVICE

Document Type and Number:

WIPO Patent Application WO/2011/096029

Kind Code:

A1

Abstract:

A method of inspecting a foreign object and a lighting inspection device wherein the presence or absence of an electrically-conductive foreign object mixed in inside a liquid crystal layer is determined by irradiating light onto a liquid crystal display panel having the liquid crystal layer provided between a pair of substrates opposite each other while uniformly pressing the surface of the liquid crystal display panel with a transparent plate, and inspecting the state of lighting of the liquid crystal display panel while inputting a signal into the liquid crystal display panel.

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Inventors:

MAKIGUCHI, Ken (())

Application Number:

JP2010/006326

Publication Date:

August 11, 2011

Filing Date:

October 26, 2010

Export Citation:

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Assignee:

SHARP KABUSHIKI KAISHA (22-22, Nagaike-cho Abeno-ku, Osaka-sh, Osaka 22, 〒5458522, JP)
シャープ株式会社 (〒22 大阪府大阪市阿倍野区長池町２２番２２号 Osaka, 〒5458522, JP)

International Classes:

G01M11/00; G02F1/13

Attorney, Agent or Firm:

MAEDA, Hiroshi et al. (Osaka-Marubeni Bldg, 5-7 Hommachi 2-chome, Chuo-ku, Osaka-sh, Osaka 53, 〒5410053, JP)

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