Title:
METHOD FOR INSPECTING LIQUID CRYSTAL DISPLAY PANEL, AND INSPECTION GAUGE
Document Type and Number:
WIPO Patent Application WO/2011/129042
Kind Code:
A1
Abstract:
A method for inspecting a liquid crystal display panel comprises a step for overlapping an inspection gauge comprising a transparent base material and a plurality of colored regions formed on the transparent base material and colored differently from each other with a display region of the liquid crystal display panel, and a step for determining a display defect of the liquid crystal display panel by comparing the respective colored regions of the inspection gauge and the display color in the display region. As a result, the presence or absence of the display defect of the liquid crystal display panel is determined.
Inventors:
HIRANO, Takaaki (())
Application Number:
JP2011/000760
Publication Date:
October 20, 2011
Filing Date:
February 10, 2011
Export Citation:
Assignee:
SHARP KABUSHIKI KAISHA (22-22, Nagaike-cho Abeno-ku, Osaka-sh, Osaka 22, 〒5458522, JP)
シャープ株式会社 (〒22 大阪府大阪市阿倍野区長池町２２番２２号 Osaka, 〒5458522, JP)
シャープ株式会社 (〒22 大阪府大阪市阿倍野区長池町２２番２２号 Osaka, 〒5458522, JP)
International Classes:
G01M11/00; G01J3/52; G02F1/13; G09F9/00
Attorney, Agent or Firm:
MAEDA, Hiroshi et al. (Osaka-Marubeni Bldg, 5-7 Hommachi 2-chome, Chuo-k, Osaka-shi Osaka 53, 〒5410053, JP)
Claims:
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