Title:
METHOD FOR INSPECTING LIQUID CRYSTAL DISPLAY PANEL, AND INSPECTION GAUGE
Document Type and Number:
WIPO Patent Application WO/2011/129042
Kind Code:
A1
Abstract:
A method for inspecting a liquid crystal display panel comprises a step for overlapping an inspection gauge comprising a transparent base material and a plurality of colored regions formed on the transparent base material and colored differently from each other with a display region of the liquid crystal display panel, and a step for determining a display defect of the liquid crystal display panel by comparing the respective colored regions of the inspection gauge and the display color in the display region. As a result, the presence or absence of the display defect of the liquid crystal display panel is determined.
Inventors:
HIRANO TAKAAKI
Application Number:
PCT/JP2011/000760
Publication Date:
October 20, 2011
Filing Date:
February 10, 2011
Export Citation:
Assignee:
SHARP KK (JP)
HIRANO TAKAAKI
HIRANO TAKAAKI
International Classes:
G01M11/00; G01J3/52; G02F1/13; G09F9/00
Foreign References:
| JP2004132976A | 2004-04-30 | |||
| JP2008241254A | 2008-10-09 | |||
| JP2004219229A | 2004-08-05 | |||
| JPH0736174U | 1995-07-04 |
Attorney, Agent or Firm:
MAEDA, Hiroshi et al. (JP)
Hiroshi Maeda (JP)
Hiroshi Maeda (JP)
Download PDF:
Claims:
Previous Patent: METHOD OF MANUFACTURING ELASTIC SHEET FOR PANEL UNIT OF VEHICLE
Next Patent: DEPOSITION APPARATUS AND DEPOSITION METHOD
Next Patent: DEPOSITION APPARATUS AND DEPOSITION METHOD