Title:
METHOD FOR INSTALLING PROBES, AND METHOD FOR DRIVING TRANSMISSION PROBE
Document Type and Number:
WIPO Patent Application WO/2019/151474
Kind Code:
A1
Abstract:
A transmission probe (1) for transmitting a guide wave that advances along the major-axis direction of a long member (3), and a reception probe (2) for receiving a guide wave resulting when the aforementioned guide wave is reflected from a prescribed location on the long member (3), are installed on the long member (3). The guide wave received by the reception probe (2) includes a guide wave forming a second signal that is noise of a desired first signal. The guide wave forming the second signal has a node in a circumferential-direction distribution of specific-direction displacement of the circumferential surface of the long member (3), and the guide wave transmitted by the transmission probe (1) is formed so that the specific-direction displacement of the guide wave forming the second signal is zero at a specific circumferential-surface position on the long member (3). This method for installing probes is provided with: a step for installing a transmission probe (1) for transmitting a guide wave on the circumferential surface of a long member (3); and a step for installing a reception probe (2) at a position on the circumferential surface of the long member (3) at which specific-direction displacement of a guide wave forming a second signal is zero.
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Inventors:
SHOJI MASANARI (JP)
OKA SOICHI (JP)
OKA SOICHI (JP)
Application Number:
PCT/JP2019/003598
Publication Date:
August 08, 2019
Filing Date:
February 01, 2019
Export Citation:
Assignee:
NIPPON TELEGRAPH & TELEPHONE (JP)
International Classes:
G01N29/04; G01N29/34; G01N29/36
Foreign References:
JP2013088118A | 2013-05-13 | |||
JP2007107885A | 2007-04-26 | |||
JP2009109390A | 2009-05-21 | |||
US20140202249A1 | 2014-07-24 |
Attorney, Agent or Firm:
MIYOSHI Hidekazu et al. (JP)
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