METHOD AND INSTRUMENT FOR POLARIZATION MEASUREMENT

WIPO Patent Application WO/1998/013676

A1

The polarization of fluorescent light or Raman scattering light which is emitted from a sample when light is applied to the sample is measured with high accuracy. Excitation light which is emitted from a pulse excitation light source (1) and is p-polarized by a polarizer (2) and a half-wave plate (3) is applied to a sample (7) and the p-polarization component intensity I�pp? and s-polarization component intensity I�ps? of the emitted fluorescent light are measured by photodetectors (13 and 14). In the same way, s-polarized excitation light is applied to the sample (7) and the p-polarization component intensity I�sp? and s-polarization component intensity I�ss? of emitted fluorescent light are measured. The G-factor is obtained from those measured values by a following formula: G = [(I�pp?.I�sp?)/(I�ps?.I�ss?)]?1/2�. Polarization responsiveness correction is performed in accordance with the G-factor to obtain the polarization of the fluorescent light.

TOYONAGA SHUJI (JP)
SHIROSHITA MASAHISA (JP)
SUGA TAKAYUKI (JP)
NAKANO YOSHITARO (JP)

PCT/JP1997/003391

April 02, 1998

September 24, 1997

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LAB MOLECULAR BIOPHOTONICS (JP)
TOYONAGA SHUJI (JP)
SHIROSHITA MASAHISA (JP)
SUGA TAKAYUKI (JP)
NAKANO YOSHITARO (JP)

G01J3/44; G01J3/447; G01J4/00; G01N21/64; G01N21/65; (IPC1-7): G01J4/00; G01N21/21; G01N21/64; G01N21/65

JPS58117439A	1983-07-13
JPS59182341A	1984-10-17
JPS55109949A	1980-08-23
JPH01209343A	1989-08-23
JPS6238363A	1987-02-19
JPS5784339A	1982-05-26
JPH0854340A	1996-02-27

Hasegawa, Yoshiki (6F. Kyobashi National Building, 13-10, Kyobashi 2-chom, Chuo-ku Tokyo 104, JP)

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