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Patent Searching and Data


Title:
METHOD FOR LEARNING AND DETECTING ABNORMAL PART OF DEVICE THROUGH ARTIFICIAL INTELLIGENCE
Document Type and Number:
WIPO Patent Application WO/2021/112577
Kind Code:
A1
Abstract:
The present invention relates to a method for learning and detecting an abnormal part of a device through artificial intelligence, the method comprising: an information collection step (S10) for collecting a current waveform of a current value that changes over time in a driving state of at least one device and collecting information about a faulty part of the device, together with current waveform information before a fault occurs in the device; a model setting step (S20) for learning, by a control unit, information collected in the information collection step (S10) and setting a reference model of a current waveform for each faulty part of the device; and a detection step (S30) for, when an abnormal symptom of the device is detected in a real-time driving state, comparing, by the control unit, a real-time current waveform of the device and the reference model, and detecting and providing an abnormal part regarding the abnormal symptom of the device.

Inventors:
LEE YOUNGKYU (KR)
Application Number:
PCT/KR2020/017523
Publication Date:
June 10, 2021
Filing Date:
December 03, 2020
Export Citation:
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Assignee:
ITS CO LTD (KR)
International Classes:
G05B23/02; G06N20/00
Foreign References:
KR101862218B12018-07-05
KR100608235B12006-08-02
KR101865086B12018-06-07
US20170285086A12017-10-05
KR101955678B12019-03-07
Attorney, Agent or Firm:
OH, Juseok (KR)
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