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Patent Searching and Data


Title:
METHOD FOR MANUFACTURING COMPOSITE SUBSTRATE AND SEMICONDUCTOR WAFER USING SAID SUBSTRATE
Document Type and Number:
WIPO Patent Application WO/2014/123097
Kind Code:
A1
Abstract:
A composite substrate (1) includes: a support substrate (11) including, as a crystal phase, 35-65% by mass of a mullite phase, and 35-65% by mass of an alumina phase; and a semiconductor film (13) disposed on the main surface (11m) of the support substrate (11). A method for manufacturing a semiconductor wafer (3) includes: a step for preparing the composite substrate (1); a step for growing at least one semiconductor layer (20) on the semiconductor film (13) of the composite substrate to form a composite substrate (2) having a semiconductor layer; and a step for removing the support substrate (11) from the composite substrate (2) having a semiconductor layer to form the semiconductor wafer (3). A method is thus provided for manufacturing a composite substrate suitable for manufacturing a high-quality semiconductor wafer with high yield and good efficiency, and a semiconductor wafer using same.

Inventors:
SEKI YUKI (JP)
SATOH ISSEI (JP)
YAMAMOTO YOSHIYUKI (JP)
MATSUBARA HIDEKI (JP)
SOGABE KOICHI (JP)
HASEGAWA MASATO (JP)
TSUJI YUTAKA (JP)
FUJII AKIHITO (JP)
Application Number:
PCT/JP2014/052493
Publication Date:
August 14, 2014
Filing Date:
February 04, 2014
Export Citation:
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Assignee:
SUMITOMO ELECTRIC INDUSTRIES (JP)
International Classes:
H01L21/02; C30B25/18; C30B29/38; H01L21/20
Foreign References:
JP2012121788A2012-06-28
JP2011007597A2011-01-13
JPH05152463A1993-06-18
JP2008297175A2008-12-11
JP2006143581A2006-06-08
Attorney, Agent or Firm:
Fukami Patent Office, p. c. (JP)
Patent business corporation Fukami patent firm (JP)
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