Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
METHOD FOR MANUFACTURING LOWER CONTACT TERMINAL OF PROBE PIN
Document Type and Number:
WIPO Patent Application WO/2013/168921
Kind Code:
A1
Abstract:
The method for manufacturing the lower contact terminal of a probe pin according to the present invention is a method for manufacturing the lower contact terminal of a probe pin used for electronic component meter-reading that comprises: (a) a step of cutting and punching a metal sheet such that a plurality of arms are mutually connected so as to form a radial shape; (b) a step of bending each of the joints of the plurality of arms such that the plurality of arms are parallel to one another; (c) a step of cutting the surfaces of the plurality of arms into a predetermined shape; and (d) a step of bending the portions cut into the predetermined shape such that they are back-to-back and protrude outward. The time required for manufacturing the probe pin can be reduced as the manufacturing process is rendered convenient and simplified, and thus manufacturing costs can be reduced.

Inventors:
CHOI JONG KOOK (KR)
Application Number:
PCT/KR2013/003718
Publication Date:
November 14, 2013
Filing Date:
April 30, 2013
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
QUALMAX TESTECH INC (KR)
International Classes:
G01R1/067; G01R19/165; G01R31/28
Foreign References:
KR100889613B12009-03-20
KR100594695B12006-06-30
JP2011191104A2011-09-29
JP2007218675A2007-08-30
Attorney, Agent or Firm:
CHOI, KYU PAL (KR)
최규팔 (KR)
Download PDF: