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Patent Searching and Data


Title:
METHOD FOR MANUFACTURING PIN FOR INSPECTING MICROELECTRODE CIRCUIT AND PIN FOR INSPECTING MICROELECTRODE CIRCUIT MANUFACTURED BY SAME
Document Type and Number:
WIPO Patent Application WO/2015/023062
Kind Code:
A1
Abstract:
A pin for inspecting a microelectrode circuit is disclosed. The pin for inspecting a microelectrode circuit according to an embodiment of the present invention comprises: a pin, at least one of both ends of which has a contact part formed therein, the pin having a resilient part having a resilient restoring force and connecting the both ends together; and a housing having a penetration part for exposing the contact part to the outside, the housing covering the resilient part, wherein the pin and the housing are simultaneously formed by a semiconductor MEMS process so that at least one surface of lower portions and the upper portions of the pin and the housing is flat.

Inventors:
KOO HWANG SUB (KR)
LEE KYU HAN (KR)
JUN BYUNG JUNE (KR)
BANG HO SUB (KR)
JUNG HEE SEOK (KR)
KIM HYUN JE (KR)
Application Number:
PCT/KR2014/006079
Publication Date:
February 19, 2015
Filing Date:
July 07, 2014
Export Citation:
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Assignee:
GIGALANE CO LTD (KR)
International Classes:
G01R1/067
Foreign References:
KR101236312B12013-02-28
JP2005317971A2005-11-10
KR20110108108A2011-10-05
KR20090117053A2009-11-12
KR20080102572A2008-11-26
Attorney, Agent or Firm:
SHINSEGI PATENT LAW FIRM (KR)
특허법인 신세기 (KR)
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