Title:
METHOD FOR MEASURING BASIS WEIGHT, METHOD FOR MANUFACTURING LAMINATED FILM, AND DEVICE FOR MEASURING BASIS WEIGHT
Document Type and Number:
WIPO Patent Application WO/2016/199683
Kind Code:
A1
Abstract:
The present invention measures the basis weight of a coating layer of a laminated film while avoiding the occurrence of measurement errors caused by variations in the film thickness. A device (30) for measuring basis weight comprises: a light projector (31a) that emits light having a central wavelength of 405 nm; a light projector (31b) that emits light having a central wavelength of 850 nm; a light receiver (32a) and a light receiver (32b) that receive light which has passed through a separator (12); and a control unit (33) that calculates the basis weight of a heat-resistant layer (4) on the basis of the transmitted light intensity of each light.
Inventors:
YAMANO TAKAYUKI (JP)
OKUGAWA TAKAHIRO (JP)
OKUGAWA TAKAHIRO (JP)
Application Number:
PCT/JP2016/066484
Publication Date:
December 15, 2016
Filing Date:
June 02, 2016
Export Citation:
Assignee:
SUMITOMO CHEMICAL CO (JP)
International Classes:
G01G17/04; G01B11/06
Foreign References:
| JPH11153417A | 1999-06-08 | |||
| JPH04355308A | 1992-12-09 | |||
| JP2003075126A | 2003-03-12 | |||
| JP2008058257A | 2008-03-13 | |||
| JP2009133725A | 2009-06-18 | |||
| JP2004205696A | 2004-07-22 | |||
| JPH11118434A | 1999-04-30 |
Attorney, Agent or Firm:
HASEGAWA, Kazuya et al. (JP)
Kazuya Hasegawa (JP)
Kazuya Hasegawa (JP)
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