Title:
METHOD FOR MEASURING DIELECTRIC CONSTANT AND SHORT-CIRCUIT STANDARD BODY
Document Type and Number:
WIPO Patent Application WO/2023/132026
Kind Code:
A1
Abstract:
The present invention has a step in which a dielectric spectroscopy system (200) measures the reflection coefficient and the admittance of calibration standard bodies (P1, P2), a step in which the dielectric spectroscopy system (200) measures the reflection coefficient of a shirt-circuit grease (Ps), and a step in which the dielectric spectroscopy system (200) measures the reflection coefficient of an object being measured. The present invention furthermore has: a step in which the dielectric spectroscopy system (200) calculates the admittance of the object being measured on the basis of the reflection coefficient and admittance of the calibration standard bodies (P1, P2), the reflection coefficient of the short-circuit grease (Ps), and the reflection coefficient of the object being measured; and a step in which the dielectric spectroscopy system (200) calculates the dielectric constant of the object being measured on the basis of the admittance of the object being measured.
Inventors:
NAKAMURA MASAHITO (JP)
TAJIMA TAKURO (JP)
SEYAMA MICHIKO (JP)
IKEDA AYUMI (JP)
TAJIMA TAKURO (JP)
SEYAMA MICHIKO (JP)
IKEDA AYUMI (JP)
Application Number:
PCT/JP2022/000211
Publication Date:
July 13, 2023
Filing Date:
January 06, 2022
Export Citation:
Assignee:
NIPPON TELEGRAPH & TELEPHONE (JP)
International Classes:
G01N22/00
Domestic Patent References:
| WO2021205503A1 | 2021-10-14 | |||
| WO2019203110A1 | 2019-10-24 |
Foreign References:
| US20140375337A1 | 2014-12-25 | |||
| KR102001423B1 | 2019-10-01 | |||
| JP2012520442A | 2012-09-06 | |||
| CN113125857A | 2021-07-16 | |||
| CN112098791A | 2020-12-18 | |||
| US20160313260A1 | 2016-10-27 | |||
| JP2010505570A | 2010-02-25 |
Attorney, Agent or Firm:
MIYOSHI Hidekazu et al. (JP)
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