Title:
METHOD FOR MEASURING FLATNESS OF PLATE MATERIAL, DEVICE FOR MEASURING FLATNESS OF PLATE MATERIAL, AND PRODUCTION METHOD FOR STEEL PLATE
Document Type and Number:
WIPO Patent Application WO/2014/185478
Kind Code:
A1
Abstract:
This method for measuring flatness of a plate material includes a step of projecting a light and dark pattern, composed of light portions and dark portions, onto a surface of a plate material traveling between adjacent rolling stands, doing so from a projection unit situated between the rolling stands, and capturing an image of the light and dark pattern by an image capture unit situated between the rolling stands, to acquire a pattern image; and a step of analyzing the acquired pattern image to measure the flatness of the plate material, wherein L0, α, β, hc, and hp satisfy the following Expression (1).
Inventors:
ISEI YOSHITO (JP)
KATO TOMOYA (JP)
AIHARA YASUHIRO (JP)
KATO TOMOYA (JP)
AIHARA YASUHIRO (JP)
Application Number:
PCT/JP2014/062895
Publication Date:
November 20, 2014
Filing Date:
May 14, 2014
Export Citation:
Assignee:
NIPPON STEEL & SUMITOMO METAL CORP (JP)
International Classes:
G01B11/25; B21B1/26; B21B39/08; B21C51/00
Foreign References:
JP4666272B1 | 2011-04-06 | |||
JPH05157537A | 1993-06-22 | |||
JPH11104721A | 1999-04-20 | |||
JP2008058036A | 2008-03-13 | |||
JP4666272B1 | 2011-04-06 | |||
JP4666273B1 | 2011-04-06 | |||
JP4797887B2 | 2011-10-19 |
Other References:
See also references of EP 2998695A4
Attorney, Agent or Firm:
Taiyo, Nakajima & Kato (JP)
Patent business corporation solar international patent firm (JP)
Patent business corporation solar international patent firm (JP)
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