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Title:
METHOD OF MEASURING NONLINEARITY SPATIAL PROFILES OF SAMPLES AND TEMPORAL PROFILES OF OPTICAL PULSES
Document Type and Number:
WIPO Patent Application WO2004019018
Kind Code:
A3
Abstract:
A method for measuring a physical function forms a symmetric composite function by combining the physical function with a reference function. The method obtains a Fourier transform of the symmetric composite function. The method calculates an inverse Fourier transform of the obtained Fourier transform, wherein the calculated inverse Fourier transform provides information regarding the physical function. The physical function can be a nonlinearity profile of a sample with at least one sample surface. The physical function can alternatively by a sample temporal waveform of a sample optical pulse.

Inventors:
OZCAN AYDOGAN (US)
DIGONNET MICHEL J F (US)
KINO GORDON S (US)
Application Number:
PCT/US2003/026311
Publication Date:
July 29, 2004
Filing Date:
August 21, 2003
Export Citation:
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Assignee:
UNIV LELAND STANFORD JUNIOR (US)
OZCAN AYDOGAN (US)
DIGONNET MICHEL J F (US)
KINO GORDON S (US)
International Classes:
G01J11/00; G01N21/63; (IPC1-7): G01N21/63; G01J11/00
Foreign References:
US6456380B12002-09-24
US5530544A1996-06-25
US4792230A1988-12-20
Other References:
OZCAN A ET AL: "INVERSE FOURIER TRANSFORM TECHNIQUE TO DETERMINE SECOND-ORDER OPTICAL NONLINEARITY SPATIAL PROFILES", APPLIED PHYSICS LETTERS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, vol. 82, no. 9, 3 March 2003 (2003-03-03), pages 1362 - 1364, XP001163010, ISSN: 0003-6951
QIU M, VILASECA R, BOTEY M, SELLARĂˆS J, PI F, AND ORRIOLS G: "Double fitting of Maker fringes to characterize near-surface and bulk second-order nonlinearities in poled silica", APPLIED PHYSICS LETTERS, vol. 76, no. 23, 5 June 2000 (2000-06-05), USA, pages 3346 - 3348, XP002266762
RAMAN KASHYAP ET AL: "PHASE-MATCHED SECOND-HARMONIC GENERATION BY PERIODIC POLING OF FUSED SILICA", APPLIED PHYSICS LETTERS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, vol. 64, no. 11, 14 March 1994 (1994-03-14), pages 1332 - 1334, XP000434288, ISSN: 0003-6951
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