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Title:
METHOD FOR MEASURING ULTRASONIC NONLINEARITY GENERATED BY HIGH-VOLTAGE PULSER
Document Type and Number:
WIPO Patent Application WO/2017/209329
Kind Code:
A1
Abstract:
The present invention relates to a method for measuring ultrasonic nonlinearity generated by a high-voltage pulser. More specifically, the method comprises: a calibration step for transmitting and receiving an ultrasonic signal to/from an object to be inspected having a reception probe attached thereto, the calibration step being performed by a receiving unit; a harmonic measurement step for transmitting a tone burst signal to the object to be inspected having a transmission/reception probe attached thereto, and receiving a tone burst signal that has passed through the object to be inspected, the harmonic measurement step being performed by the receiving unit; a harmonic measurement step for transmitting a tone burst signal to the object to be inspected having a transmission probe attached thereto, and receiving the transmitted tone burst signal, the harmonic measurement step being performed by a transmitting unit; a calibration step for transmitting and receiving an ultrasonic signal to/from the object to be inspected having the transmission probe attached thereto, the calibration step being performed by the transmitting unit; and a step for measuring the ultrasonic nonlinearity of the object to be inspected by comparing fundamental frequency and harmonic components measured by the receiving unit and fundamental frequency and harmonic components measured by the transmitting unit.

Inventors:
JHANG KYUNG YOUNG (KR)
KIM JONG BEOM (KR)
Application Number:
PCT/KR2016/005935
Publication Date:
December 07, 2017
Filing Date:
June 03, 2016
Export Citation:
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Assignee:
INDUSTRY-UNIV COOPERATION FOUNDATION HANYANG UNIV (KR)
International Classes:
G01N29/04; G01N29/07; G01N29/34
Domestic Patent References:
WO2014104563A12014-07-03
WO2014178518A12014-11-06
Foreign References:
KR101477607B12014-12-31
JP2007155730A2007-06-21
KR100542651B12006-01-11
Attorney, Agent or Firm:
SHIM, Kyoung-Shik et al. (KR)
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