Title:
METHOD FOR OBSERVING JITTER IN SEMICONDUCTOR INTEGRATED CIRCUIT, AND JITTER OBSERVATION SYSTEM
Document Type and Number:
WIPO Patent Application WO/2017/098648
Kind Code:
A1
Abstract:
[Problem] To provide a method for observing jitter in a semiconductor integrated circuit which is able to indirectly observe jitter even in a semiconductor integrated circuit including a complex gate in which jitter cannot be easily observed directly.
[Solution] A pointer is shifted in the time-axis direction with respect to the waveform of a certain voltage in the semiconductor integrated circuit to determine whether a waveform output coincides with an expectation. When the waveform output constantly coincides with the expectation, the number of error detections is determined to be zero, whereas when the waveform output does not coincide with the expectation intermittently or continuously, the number of error detections is stored.
Inventors:
NAKAJIMA NORIO (JP)
USUGI TATSUNORI (JP)
HIGASHI RYOUTA (JP)
USUGI TATSUNORI (JP)
HIGASHI RYOUTA (JP)
Application Number:
PCT/JP2015/084726
Publication Date:
June 15, 2017
Filing Date:
December 10, 2015
Export Citation:
Assignee:
HITACHI LTD (JP)
International Classes:
G01R29/02
Foreign References:
| JP2001148161A | 2001-05-29 | |||
| JP2008151719A | 2008-07-03 |
Attorney, Agent or Firm:
OHGA, Shinji et al. (JP)
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