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Title:
METHOD FOR PROCESSING BEAM FAILURE IN ELECTRONIC DEVICE, AND ELECTRONIC DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/251198
Kind Code:
A1
Abstract:
According to various embodiment, an electronic device may comprise: a transceiver for receiving information, related to at least one reference signal, from a base station; and a communication processor which receives at least one reference signal corresponding to the received information through the transceiver on the basis of a first reception beam of the electronic device, determines whether or not a beam failure occurrence condition is satisfied on the basis of a measurement result related to the at least one received reference signal, increases a beam failure counter if the beam failure occurrence condition is determined to be satisfied as a result of the determination, changes the reception beam from the first reception beam to a second reception beam when the beam failure counter satisfies a first condition, and controls to transmit a request for beam failure recovery to the base station through the transceiver when the beam failure counter satisfies a second condition after satisfying the first condition. Various other embodiments are also possible.

Inventors:
WOO JUNYOUNG (KR)
JUNG EUICHANG (KR)
Application Number:
PCT/KR2020/006950
Publication Date:
December 17, 2020
Filing Date:
May 29, 2020
Export Citation:
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Assignee:
SAMSUNG ELECTRONICS CO LTD (KR)
International Classes:
H04B7/0408; H04B7/06; H04B7/08; H04B17/318; H04W24/04; H04W24/10
Domestic Patent References:
WO2019032882A12019-02-14
Foreign References:
US20180227899A12018-08-09
US20190159100A12019-05-23
US20190173740A12019-06-06
Other References:
ETSI, 3GPP: "TSG RAN: NR; Medium Access Control (MAC) protocol specification (Release 15", 3GPP TS 38.321 V15.5.0, 9 April 2019 (2019-04-09), XP014345037
Attorney, Agent or Firm:
LEE, Keon-Joo et al. (KR)
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