Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
METHOD FOR REDUCING FLUCTUATION OF CUT−OFF VOLTAGE, CATHODE FOR ELECTRONIC TUBE, AND METHOD FOR MANUFACTURING CATHODE FOR ELECTRONIC TUBE
Document Type and Number:
WIPO Patent Application WO/2004/001784
Kind Code:
A1
Abstract:
A method for reducing fluctuation of cut−off voltage of a cathode for an electronic tube in which a metal layer (9) is formed by heating on a surface (7a) of the cathode base body (7) and is used to protrude a cathode base body (7), an electron emissive material layer (11) is formed on the front side (7a) of the cathode base body (7) directly or via the metal layer (9), and a heating means (5) is provided for emitting thermoelectrons from a front side (11a) of the electron emissive material layer (11) by heating the electron emissive material layer (11). The front side (11a) of the electron emissive material layer (11) is deformed and protruded forward by the length of reduction of the consumed front side (11a) of the electron emissive material layer (11) because of the forward protrusion&sol deformation of the cathode base body (7) caused by the metal layer (9) formed by heating by the heating means (5).

More Like This:
Inventors:
Sawada, Takao (Mitsubishi Denki Kabushiki Kaisha, 2-3 Marunouchi 2-chom, Chiyoda-ku Tokyo, 100-8310, JP)
Nakata, Shuhei (Mitsubishi Denki Kabushiki Kaisha, 2-3 Marunouchi 2-Chom, Chiyoda-ku Tokyo, 100-8310, JP)
Oono, Katsumi (Mitsubishi Denki Kabushiki Kaisha, 2-3 Marunouchi 2-chom, Chiyoda-ku Tokyo, 100-8310, JP)
Yamaguchi, Hiroshi (Mitsubishi Denki Kabushiki Kaisha, 2-3 Marunouchi 2-chom, Chiyoda-ku Tokyo, 100-8310, JP)
Application Number:
PCT/JP2002/006127
Publication Date:
December 31, 2003
Filing Date:
June 19, 2002
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
MITSUBISHI DENKI KABUSHIKI KAISHA (2-3 Marunouchi 2-chome, Chiyoda-ku, Tokyo, 100-8310, JP)
Sawada, Takao (Mitsubishi Denki Kabushiki Kaisha, 2-3 Marunouchi 2-chom, Chiyoda-ku Tokyo, 100-8310, JP)
Nakata, Shuhei (Mitsubishi Denki Kabushiki Kaisha, 2-3 Marunouchi 2-Chom, Chiyoda-ku Tokyo, 100-8310, JP)
Oono, Katsumi (Mitsubishi Denki Kabushiki Kaisha, 2-3 Marunouchi 2-chom, Chiyoda-ku Tokyo, 100-8310, JP)
Yamaguchi, Hiroshi (Mitsubishi Denki Kabushiki Kaisha, 2-3 Marunouchi 2-chom, Chiyoda-ku Tokyo, 100-8310, JP)
International Classes:
H01J1/14; H01J1/20; H01J1/26; H01J9/04; H01J1/13; H01J1/20; H01J9/04; (IPC1-7): H01J1/26; H01J1/14; H01J1/20; H01J9/04
Attorney, Agent or Firm:
Yoshida, Shigeaki (10th floor, Sumitomo-seimei OBP Plaza Bldg. 4-70, Shiromi 1-chome, Chuo-k, Osaka-shi Osaka, 540-0001, JP)
Download PDF:



 
Previous Patent: SCREENING ELECTRODE

Next Patent: FIELD EMISSION DEVICE