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Patent Searching and Data


Title:
METHOD FOR SEPARATING FINGERPRINT FROM FINGERPRINT OVERLAY IMAGE USING DEEP-LEARNING ALGORITHM, AND DEVICE THEREFOR
Document Type and Number:
WIPO Patent Application WO/2022/131517
Kind Code:
A1
Abstract:
Disclosed are a method for separating a fingerprint from a fingerprint overlay image using a deep-learning algorithm, and a device therefor. The fingerprint separation device: obtains a fingerprint separation image by separating a detection target fingerprint from a fingerprint overlay image, in which at least two fingerprints are overlaid, through a first deep-learning network trained to separate the overlaid fingerprints; generates a replacement image in which a region of interest, in which the plurality of fingerprints are overlaid in the fingerprint overlay image, is replaced with a region, corresponding to the region of interest, in the fingerprint separation image; and separates the background and the detection target fingerprint in the replacement image through a second deep-learning network trained to separate the background and the fingerprint, and outputs the detection target fingerprint.

Inventors:
LEE BYOUNGHO (KR)
CHAE MINSEOK (KR)
LEE JUHYUN (KR)
YOO DONGHEON (KR)
CHO JAEBUM (KR)
Application Number:
PCT/KR2021/014664
Publication Date:
June 23, 2022
Filing Date:
October 20, 2021
Export Citation:
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Assignee:
SEOUL NAT UNIV R&DB FOUNDATION (KR)
International Classes:
G06K9/00; G06N3/08; G06N5/02; G06T3/60; G06T5/00; G06V10/24; G06V10/26
Foreign References:
KR101881097B12018-07-23
US20180018499A12018-01-18
KR20170002892A2017-01-09
Other References:
YOO DONGHEON; CHO JAEBUM; LEE JUHYUN; CHAE MINSEOK; LEE BYOUNGHYO; LEE BYOUNGHO: "FinSNet: End-to-End Separation of Overlapped Fingerprints Using Deep Learning", IEEE ACCESS, IEEE, USA, vol. 8, 17 November 2020 (2020-11-17), USA , pages 209020 - 209029, XP011822760, DOI: 10.1109/ACCESS.2020.3038707
FANGLIN CHEN ; JIANJIANG FENG ; ANIL K. JAIN ; JIE ZHOU ; JIN ZHANG: "Separating Overlapped Fingerprints", IEEE TRANSACTIONS ON INFORMATION FORENSICS AND SECURITY, IEEE, USA, vol. 6, no. 2, 1 June 2011 (2011-06-01), USA, pages 346 - 359, XP011322765, ISSN: 1556-6013, DOI: 10.1109/TIFS.2011.2114345
Attorney, Agent or Firm:
Y.P.LEE, MOCK & PARTNERS (KR)
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