METHOD AND SYSTEM FOR DETECTING MECHANICAL RESISTANCE OF PHOTOVOLTAIC ASSEMBLY

WIPO Patent Application WO/2019/127307

A1

A method and system for detecting the mechanical resistance of a photovoltaic assembly. The method sequentially comprises: carrying out an appearance defect inspection on a photovoltaic assembly according to a predetermined appearance inspection standard (S1); testing a light attenuation rate of the photovoltaic assembly (S2); when the light attenuation rate is less than a predetermined attenuation threshold, inspecting an output power of the photovoltaic assembly under predetermined test conditions (S3); carrying out a mechanical resistance test on the photovoltaic assembly (S4); carrying out an appearance defect inspection on the photovoltaic assembly according to the appearance inspection standard (S5); inspecting the output power of the photovoltaic assembly under the predetermined test conditions (S6); and ending mechanical resistance detection (S7). The method provides a reliable analysis basis and determination standard for the usage performance, service life and failure period of a photovoltaic assembly used for a shared bicycle under different severe mechanical usage conditions, thereby compensating for the lack of a detection process for the photovoltaic assembly used for a shared bicycle.

SUN JUNBO (CN)
YANG SHENG (CN)
AO HUAMING (CN)

PCT/CN2017/119662

July 04, 2019

December 29, 2017

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MIASOLE PHOTOVOLTAIC TECH CO LTD (CN)

H02S50/10; H02S50/15

CN102323149A	2012-01-18
CN204422163U	2015-06-24
CN104811136A	2015-07-29
CN106226019A	2016-12-14
JP2017212834A	2017-11-30

DAI SONGYUAN: "Key Science and Technology of thin film cells", 31 January 2013 (2013-01-31), pages 102 - 116

PACIFIC CHINA PATENT AGENT CO., LTD. (CN)

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